NachhaltigF: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenBeitrag (Sammelband oder Tagungsband)
Johannes Liebl, Horst Linthe, Sebastian Sitzberger, Rolf Rascher
Interferometric measurement of highly accurate flat surfaces
Proceedings of SPIE 10009 (Third European Seminar on Precision Optics Manufacturing, 100090Y [April 12th 2016, Teisnach])
2016
DOI: 10.1117/12.2235525
Abstract anzeigen
The most important part in manufacturing precision optics is a reliable measurement procedure which provides results a few times more accurate than the quality to be produced. In general two specific values are important, the repeatability of several measurements which are done in a row and the absolute accuracy which is mostly defined by the systematical error of the measurement device. The repeatability can be improved relatively simple, by increasing the number of measurements and a following averaging step. To increase the absolute accuracy of a measurement device in the field of precision optics is far more challenging.
In this paper several interferometer absolute testing methods to measure flat surfaces are compared. The main objective was to name a value for the achievable accuracy. Therefor four different methods were analyzed: 1. The three flat test, a method which is already used several decades to determine the quality of a flat surface. As a result, two absolute measured profiles, horizontal and vertical, can be calculated. 2. The multi rotation test, an extension of the classical three flat test. The big advantage of this method is a fully three dimensional map of the systematical error. 3. The systematical error calculated by the SSI-A. Hereby several subapertures are measured over the whole surface. The redundant information’s of the overlapping regions can be used to calculate the systematical error of the system. 4. The rotation of the transmission flat relatively to the interferometer. Thereby the rotation unsymmetrical errors can be calculated and subtracted. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
NachhaltigF: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenBeitrag (Sammelband oder Tagungsband)
Sebastian Sitzberger, Rolf Rascher
An investigation on the efficiency of the manufacturing of components in precision optics
Proceedings of SPIE 10009 (Third European Seminar on Precision Optics Manufacturing, 100090Y [April 12th 2016, Teisnach])
2016
DOI: 10.1117/12.2236137
Abstract anzeigen
By adaption and coordination of successive process steps the efficiency of producing optics can be improved. In the beginning of this investigation, the focus is on two crucial process steps of the optical manufacturing process.
First, there is the optical and mechanical design of the optical part and system. In this context, it is important to consider what modifications compared to the current standard design are possible respectively useful. Thus, the modifications will only concentrate on parts of the optic that do not interfere with the optical functionality. Furthermore in this part of the study the main aspect is the clamping situation of the optical part in a holder or an optical system. It will be discussed, whether it is useful to add special clamping surfaces respectively a clamping flange in contrast to the standard design. The faultless functioning of the optics has always first priority.
Second, the manufacturing process itself has a great number of single steps. Therefore, a main part of the research is the investigation of current clamping situations in optics manufacturing, with prospect to improve them in order to work perfectly with the design modifications, as mentioned above. This part of the investigation focuses on the clamping system for the lens on each machine necessary for manufacturing.
In the scope of this paper the authors want to summarize characteristics and deficits of current clamping systems and workpiece mounts and give a prospect of the following course of action. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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