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Suche nach „[M.] [Wilkening]“ hat 24 Publikationen gefunden
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    MobilNachhaltigTC Plattling MoMo

    Vortrag

    A. Dunst, Michael Sternad, V. Epp, M. Wilkening

    Fast Li self-diffusion in Li-Si Electrochemically Prepared from Semiconductor Grade, Monocrystalline Silicon

    15th European Conference on Solid State Chemistry (ECSSC), Wien, Österreich

    MobilNachhaltigTC Plattling MoMo

    Zeitschriftenartikel

    H. Bülter, Michael Sternad, M. Wilkening, G. Wittstock

    Impact of the Native SiO2 Surface Layer on the Electron Transfer at Amorphous Si Electrodes

    ECS Transactions, vol. 68, no. 2, pp. 1-11

    DOI: 10.1149/06802.0001ecst

    Abstract anzeigen

    The electron transfer at uncharged microstructured and planar amorphous (a-)Si was characterized using the feedback mode of scanning electrochemical microscopy (SECM) and 2,5-di-tert-butyl-1,4-dimethoxybenzene as redox mediator in carbonate electrolytes. Approach curves and images demonstrate that the electron transfer rate at pristine a-Si is relatively small due to the native SiO2 surface layer. In addition, the electron transfer rates show local variations because of the heterogeneous coverage of SiO2. After removal of the SiO2 layer, the effect of the solid electrolyte interphase (SEI) on electron transport rate can be studied. The SiO2 layer is at least partially removed by approach curve contact and scratching with the microelectrode probe. After SiO2 removal, the electron transfer rates increase strongly and remain heterogeneous.

    MobilNachhaltigTC Plattling MoMo

    Vortrag

    H. Bülter, Michael Sternad, M. Wilkening, G. Wittstock

    Comparison of Spatiotemperoal Changes of SEI Properies on Different Anodes by SECM

    ECS Conference on Electrochemical Energy Conversion & Storage with SOFC-XIV, Glasgow, United Kingdom

    MobilNachhaltigTC Plattling MoMo

    Zeitschriftenartikel

    H. Bülter, Michael Sternad, Santos Sardinha, Eduardo dos, J. Witt, C. Dosche, M. Wilkening, G. Wittstock

    Investigation of the Electron Transfer at Si Electrodes: Impact and Removal of the Native SiO 2 Layer

    Journal of The Electrochemical Society, vol. 163, no. 3

    DOI: 10.1149/2.0731603jes

    Abstract anzeigen

    Silicon is considered as one of the promising alternatives to graphite as negative electrode material in lithium-ion batteries. The electron transfer at uncharged microstructured and planar Si was characterized using the feedback mode of scanning electrochemical microscopy (SECM) and 2,5-di-tert-butyl-1,4-dimethoxybenzene as redox mediator. Approach curves and images demonstrate that the electron transfer rate constants at pristine Si are relatively small due to the native SiO2 surface layer. In addition, the electron transfer rate constants show local variations because of the heterogeneous coverage of SiO2. The SiO2 layer is at least partially removed by mechanical contact and abrasion with the microelectrode probe. After SiO2 removal by the microelectrode or by a hydrofluoric acid dip, the electron transfer rate constants increase strongly and remain heterogeneous. Moreover, the surface of the Si electrodes is at least stable over hours after SiO2 removal. The consequences for investigating the formation of the solid electrolyte interphase (SEI) on Si are discussed.