InformaApp - Publikationen

In 2012 a well-known company in the field of high precision optics assigned the University of Applied Sciences Deggendorf to determine a suitable parameter field for the active fluid jet polishing (AFJP) process in order to reach a surface accuracy of at least lambda / 5. The active fluid jet polishing is a relatively new and an affordable sub-aperture polishing process. For a fast and precise identification of the parameter field a considered design of experiment is necessary. The available control variables were the rotational speed of the nozzle, the distance between the test object and the jet, the feed rate, the material of the pin inside the nozzle and the material of the test object itself. In order to reach a significant data density on the one hand and to minimize the number of test runs on the other hand a meander shaped tool path was chosen. At each blank nine paths had been driven whereby at each path another parameter combination was picked. Thus with only one test object nine parameter settings may be evaluated. For the automatized analysis of the tracks a software tool was developed. The software evaluates ten sections which orthogonally intersect the nine tracks on the test-lens. The significant measurement parameters per section are the width and the height of each path as well as the surface roughness within the polished tracks. With the aid of these parameters and further statistical evaluations a suitable parameter field for the goal to find a constant and predictable removal spot was determined. Furthermore up to now over 60 test runs have been successfully finished with nine parameter combinations in each case. As a consequence a test evaluation by hand would be very time-consuming and the software facilitates it dramatically.

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Maschinenbau und Mechatronik

Beitrag (Sammelband oder Tagungsband)

Florian Schneider, Roland Maurer, Christine Wünsche, R. Stamp, G. Smith

Analysis of three different measurement strategies carried out with the TII-3D coordinate measurement system

SPIE Optics + Photonics 2013, Optical Engineering + Applications

2013

DOI: 10.1117/12.2024001

Abstract anzeigen

Together with the group of interferometry based systems, coordinate measurement machines are an essential part of the metrology in the modern optical industry. Coordinate measurement machines commonly consist of a multi axes framework. They are designed to operate in a defined three dimensional work zone, where every possible point can be reached by the measurement tool tip. This basic design principle leads to some interdependent challenges. A detailed measurement result needs a large amount of measurement points to detect even minor irregularities and short-wave errors. However, a rising of the amount of measurement points increases the corresponding measurement time analogous. On the other hand, the extended operation time increases the access of undesired thermal and dynamic influences, which cause multiple errors to the measurement result. Furthermore, modern production processes need rapid metrology systems to aid the machining time. This paper discusses results obtained by operating with three different measurements in order to find an agreement between speed and certainty of the coordinate measurement machine. The topographic coordinate measurement system TII- 3D had been re-developed at the University of Applied Sciences Deggendorf in the laboratory of optical Engineering and it is equipped with three different measurement strategies. The first mode, the Track-Mode operates in concentric circles on top of the surface of the object to be measured. The Spiral-Mode measures along a dynamic moveable spiral line and the Section-Mode produces multiple cross-sections. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Maschinenbau und Mechatronik

Beitrag (Sammelband oder Tagungsband)

Roland Maurer, Florian Schneider, Christine Wünsche, Rolf Rascher

Calculation of the reference surface error by analyzing a multiple set of sub-measurements

SPIE Optics + Photonics 2013, Optical Manufacturing and Testing X, volume 8838

2013

DOI: 10.1117/12.2024003

Abstract anzeigen

In the field of precision optics the interferometry is the most applied measurement method to test spherical and flat objects. In principle, a standard interferometer setup is limited to these surface geometries, but interferometric systems may be modified with the aid of CGH’s or the stitching technology. As a consequence aspherical shapes and even freeform optics are measurable up to a certain extent. In an interferometric measurement the measured variable is the optical path difference (OPD) between the reference wave and the test wave. Based on the detected OPD the surface error of the test object is calculated by phase shifting methods for instance. It is evident, that the error from the reference surface affects the determination of the test object surface error. One option to face this problem is the calibration of the system prior to the measurement. For this the determination of the reference surface error may be realized with the aid of a two sphere test or a random ball test e.g. [1]. In the well-known SSI-technology from QED technologies the reference surface error is calculated on the basis of the sub-measurements. Due to the self-calibrating nature of the QED stitching principle [2-4] a calibration of the system prior to the measurement is not necessary. The University of Applied Sciences Deggendorf has implemented a similar algorithm to estimate the reference wave front error, or to be exact the error of the whole optical system, based on a multiple set of sub-measurements. This paper describes the applied algorithm in detail and discusses the results. To verify the implemented tool the results are compared to the outcomes of the QED stitching software. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Maschinenbau und Mechatronik

Vortrag

Roland Maurer, Florian Schneider

Tactile and Contactless Measurement of an Optical Surface

6th High Level Expert Meeting, asphere and free form metrology, Braunschweig

2013

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen

Vortrag

Roland Maurer

Stitching in der Messtechnik

6. Optikseminar - Agenda zur modernen Optikfertigung, Teisnach

2013

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen

Vortrag

Roland Maurer, Christian Schopf

Determination of a suitable parameter field for the active fluid jet polishing process

Optifab 2013, Rochester, NY, USA

2013

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen

Vortrag

Roland Maurer

Calculation of the reference surface error by analyzing a multiple set of sub-measurements

SPIE Optics + Photonics 2013, San Diego, CA, USA

2013

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen

Vortrag

Roland Maurer

Aktuelle Messtechnik am Technologie Campus Teisnach

Photonik Bayern

2012

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Maschinenbau und Mechatronik I: Hochschulleitung und -einrichtungen

Zeitschriftenartikel

Christian Vogt, S. Sinzinger, H. Adelsberger, Roland Maurer, Florian Schneider, R. Mandler, L. Kuepper, Rolf Rascher, Peter Sperber

An Experimental Study on a Flexible Grinding Tool

Advanced Materials Research, vol. 325, pp. 91-96

2011

DOI: 10.4028/www.scientific.net/AMR.325.91

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen

Vortrag

Roland Maurer

Physical marker based stitching process of circular and non-circular interferograms

Optical Metrology 2011, München

2011

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Maschinenbau und Mechatronik I: Hochschulleitung und -einrichtungen

Beitrag (Sammelband oder Tagungsband)

Roland Maurer, Florian Schneider, Christian Vogt, Markus Schinhärl, Peter Sperber, Rolf Rascher

Physical marker based stitching process of circular and non-circular interferograms

Proc. SPIE 8083, Modeling Aspects in Optical Metrology III (SPIE Optical Metrology; May 20122; Munich, Germany)

2011

DOI: 10.1117/12.889491

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen

Vortrag

Roland Maurer

Stitching-Interferometrie zur Vermessung großer Teleskopspiegel

Cluster Sensorik Regensburg, Workshop Optische 2D/3D-Prüf- und Messtechniken, Regensburg

2011

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Elektrotechnik und Medientechnik

Zeitschriftenartikel

Engelbert Hofbauer, Horst Linthe, Roland Maurer

Messunsicherheit bei der interferometrischen Formvermessung

Photonik - Fachzeitschrift für die optischen Technologien, no. 2

2011

Abstract anzeigen

Bei der Herstellung von Präzisionsoptiken spielt die Qualitätssicherung eine wichtige Rolle. Die Referenzflächen interferometrischer Geräte dürfen gewisse Grenzen nicht überschreiten, damit die Toleranzen in der Fertigung mit Sicherheit eingehalten werden können. Die Vermessung der Vergleichs- und Referenzoptiken der Messmittel ermöglicht die Klassifizierung der Referenzobjektive mit λ/10, λ/20, λ/30 oder λ/40 und damit eine zuverlässige Beurteilung der Fertigungsprozesse in der Produktion.

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen

Vortrag

Roland Maurer

Stitching-Interferometry

4. Optikseminar, Teisnach

2010

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen

Vortrag

Roland Maurer

Stitching-Interferometry

2. International Workshop “Novel Developments and Applications in Sensor Technology”, Coburg

2010

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Maschinenbau und Mechatronik I: Hochschulleitung und -einrichtungen

Beitrag (Sammelband oder Tagungsband)

Florian Schneider, Markus Schinhärl, Christian Vogt, Roland Maurer, Peter Sperber, Rolf Rascher, R. Stamp, G. Smith

Effects of mechanical inaccuracies on the measurement result in metrology systems

Proceedings of the 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, vol. 7656

2010

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Maschinenbau und Mechatronik

Vortrag

Florian Schneider, Christian Vogt, Roland Maurer

Vibration errors caused by tactile measurements

1st International Euspen Challenge, Jena

2010

F: Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen F: Maschinenbau und Mechatronik I: Hochschulleitung und -einrichtungen

Vortrag

Florian Schneider, Christian Vogt, Roland Maurer, Rolf Rascher, Peter Sperber

Effects of mechanical inaccuracies on the measurement result in metrology systems

SPIE Conference, Dalian, China