Publikationen
Suche nach „[Roland] [Maurer]“ hat 22 Publikationen gefunden
Suchergebnis als PDFBeitrag (Sammelband oder Tagungsband)
Engelbert Hofbauer, Rolf Rascher, Thomas Stubenrauch, Johannes Liebl, Roland Maurer, et al.
Approach to the measurement of astronomical mirrors with new procedures
Optical Metrology 2013, Optical Measurement Systems for Industrial Inspection VIII, volume 8788
2013
Beitrag (Sammelband oder Tagungsband)
Roland Maurer, Florian Schneider
Tactile and Contactless Measurement of an Optical Surface
Proceedings of the 6th High Level Expert Meeting (HLEM), asphere and free form metrology, Braunschweig
2013
Beitrag (Sammelband oder Tagungsband)
Roland Maurer, Heiko Biskup, Christian J. Trum, Rolf Rascher, Christine Wünsche
Determination of a suitable parameter field for the active fluid jet polishing process
Optifab 2013, vol. Volume 8884
2013
ISBN: 9780819497475
Beitrag (Sammelband oder Tagungsband)
Florian Schneider, Roland Maurer, Christine Wünsche, R. Stamp, G. Smith
Analysis of three different measurement strategies carried out with the TII-3D coordinate measurement system
SPIE Optics + Photonics 2013, Optical Engineering + Applications
2013
Beitrag (Sammelband oder Tagungsband)
Roland Maurer, Florian Schneider, Christine Wünsche, Rolf Rascher
Calculation of the reference surface error by analyzing a multiple set of sub-measurements
SPIE Optics + Photonics 2013, Optical Manufacturing and Testing X, volume 8838
2013
Vortrag
Roland Maurer, Florian Schneider
Tactile and Contactless Measurement of an Optical Surface
6th High Level Expert Meeting, asphere and free form metrology, Braunschweig
2013
Vortrag
Stitching in der Messtechnik
6. Optikseminar - Agenda zur modernen Optikfertigung, Teisnach
2013
Vortrag
Roland Maurer, Christian Schopf
Determination of a suitable parameter field for the active fluid jet polishing process
Optifab 2013, Rochester, NY, USA
2013
Vortrag
Calculation of the reference surface error by analyzing a multiple set of sub-measurements
SPIE Optics + Photonics 2013, San Diego, CA, USA
2013
Vortrag
Aktuelle Messtechnik am Technologie Campus Teisnach
Photonik Bayern
2012
Zeitschriftenartikel
Christian Vogt, S. Sinzinger, H. Adelsberger, Roland Maurer, Florian Schneider, R. Mandler, L. Kuepper, Rolf Rascher, Peter Sperber
An Experimental Study on a Flexible Grinding Tool
Advanced Materials Research, vol. 325, pp. 91-96
2011
Vortrag
Physical marker based stitching process of circular and non-circular interferograms
Optical Metrology 2011, München
2011
Beitrag (Sammelband oder Tagungsband)
Roland Maurer, Florian Schneider, Christian Vogt, Markus Schinhärl, Peter Sperber, Rolf Rascher
Physical marker based stitching process of circular and non-circular interferograms
Proc. SPIE 8083, Modeling Aspects in Optical Metrology III (SPIE Optical Metrology; May 20122; Munich, Germany)
2011
Vortrag
Stitching-Interferometrie zur Vermessung großer Teleskopspiegel
Cluster Sensorik Regensburg, Workshop Optische 2D/3D-Prüf- und Messtechniken, Regensburg
2011
Zeitschriftenartikel
Engelbert Hofbauer, Horst Linthe, Roland Maurer
Messunsicherheit bei der interferometrischen Formvermessung
Photonik - Fachzeitschrift für die optischen Technologien, no. 2
2011
Vortrag
Stitching-Interferometry
4. Optikseminar, Teisnach
2010
Vortrag
Stitching-Interferometry
2. International Workshop “Novel Developments and Applications in Sensor Technology”, Coburg
2010
Beitrag (Sammelband oder Tagungsband)
Florian Schneider, Markus Schinhärl, Christian Vogt, Roland Maurer, Peter Sperber, Rolf Rascher, R. Stamp, G. Smith
Effects of mechanical inaccuracies on the measurement result in metrology systems
Proceedings of the 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, vol. 7656
2010
Vortrag
Florian Schneider, Christian Vogt, Roland Maurer
Vibration errors caused by tactile measurements
1st International Euspen Challenge, Jena
2010
Vortrag
Florian Schneider, Christian Vogt, Roland Maurer, Rolf Rascher, Peter Sperber
Effects of mechanical inaccuracies on the measurement result in metrology systems
SPIE Conference, Dalian, China
2010