Publikationen
Suche nach „[R.] [Rodríguez]“ hat 9 Publikationen gefunden
Suchergebnis als PDFVortrag
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, Manuel Bogner, R. Rodríguez, M. Nafría
Protective nanometer films for reliable Cu-Cu connections
Invited Talk
IEEE International Reliability Physics Symposium (IRPS), San Francisco, CA, USA
2018
Beitrag (Sammelband oder Tagungsband)
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, Manuel Bogner, R. Rodríguez, M. Nafría
Protective nanometer films for reliable Cu-Cu connections
Best Paper Award
Proceedings of the 28th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) [25-28 September, 2017; Bordeaux, Frankreich]
2017
Zeitschriftenartikel
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, R. Rodríguez, M. Nafría
Numerical Study of Hydrodynamic Forces for AFM Operations in Liquid Scanning (Article ID 6286595, 12 pages)
Scanning, no. Article ID 6286595, pp. 1-12
2017
Zeitschriftenartikel
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, Manuel Bogner, R. Rodríguez, M. Nafría
Protective nanometer films for reliable Cu-Cu connections
Microelectronics Reliability, vol. 76-77, no. September, pp. 383-389
2017
Zeitschriftenartikel
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, R. Rodríguez, M. Nafría
Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques
Applied Surface Science, vol. 356, pp. 921-926
2015
DOI: 10.1016/j.apsusc.2015.08.182
Zeitschriftenartikel
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, R. Rodríguez, M. Nafría
Nanoscale characterization of copper oxide films by Kelvin Probe Force Microscopy
Thin Solid Films, vol. 584, no. June 2015, pp. 310-315
2015
DOI: 10.1016/j.tsf.2015.01.071
Vortrag
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, R. Rodríguez, M. Nafría
Characterization of Self-Assembled Monolayers on Copper by Scanning Probe Microscopy
16th International Conference on Thin Films (ICTF16), Dubrovnik, Kroatien
2014
Vortrag
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, R. Rodríguez, M. Nafría
Nanoscale copper oxide characterization with Kelvin Probe Force Microscopy
Posterpräsentation
The 7th International Conference on Technological Advances of Thin Films & Surface Coatings (THINFILMS2014), Chongquing, China
2014
Vortrag
Tobias Berthold, Günther Benstetter, Werner Frammelsberger, R. Rodríguez, M. Nafría, Raimund Förg
Analysis of copper oxide films by combined scanning microscopy
6th International Conference on Technological Advances of Thin Films & Surface Coatings (THINFILMS2012), Singapur, Singapur
2012