Suche nach „[Igor] [Makarenko]“ hat 3 Publikationen gefunden

F: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenF: Maschinenbau und Mechatronik

Zeitschriftenartikel

Rolf Rascher, Igor Makarenko

Use of ELID-grinding on brittle-hard materials

International Journal of Mechatronics and Manufacturing Systems, vol. 4, no. 6, pp. 553-568

2011

DOI: 10.1504/IJMMS.2011.044105

Abstract anzeigen

Abstract: Electrolytic in-process dressing (ELID) is a grinding technology which enables to manufacture surfaces in a quality that is close to polished on advanced, brittle-hard materials such as used in optics. ELID grinding requires exactly aligned machining pa rameters of the grinding process. Sapphire is, due to its crystal structure, difficult to m achine. There is a request for thin, i.e., below 0.2 mm thickness, sub-surface dama ge free wafers. To grind sapphire, the material’s behaviour is to be c onsidered. Studies on the necessary oxide layer on the ELID grinding wheel and influe nces on its build-up process will be presented. In-feed and grinding velocity are varied and the results on wear, removal rate and surface quality are shown. The influence of the coolant and the stiffness of the machine, the grinding forces and pressure are evaluated. The ELID grinding is compared to conventio nal grinding. The achieved excellent surface roughness on sapphire is discussed

F: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenF: Maschinenbau und MechatronikI: Hochschulleitung und -einrichtungen

Beitrag (Sammelband oder Tagungsband)

Igor Makarenko, Christian Vogt, Rolf Rascher, Peter Sperber, Thomas Stirner

ELID supported grinding of thin sapphire wafers

Proceedings of SPIE: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, Volume 7655

2010

F: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenF: Maschinenbau und Mechatronik

Vortrag

Igor Makarenko, Rolf Rascher

ELID supported grinding of thin Sapphire wafers

5th SPIE International Symposium on Advanced Optical Manufacturing and Testing Technologies, Dalian, China

2010