NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
H. Fan, Y. Zhang, D. Liu, C. Niu, L. Liu, W. Ni, Y. Xia, Z. Bi, Günther Benstetter, G. Lei
Tensile stress-driven cracking of W fuzz over W crystal under fusion-relevant He ion irradiations
Nuclear Fusion, vol. 60, no. 4
2020
DOI: 10.1088/1741-4326/ab71bb
Abstract anzeigen
Although W fuzz is formed in the divertor region of the fusion reactor, no theory may clearly explain the W fuzz growth mechanism. In this study, we observe the growth process of W fuzz over W crystal under ITER-relevant He ion irradiations. We propose the tensile stress-driven cracking of nano-structured fuzz during the initial growth of W fuzz. We demonstrate that the existence of tensile stress is due to the swelling of He nano-bubbles in the fuzz. After this cracking, the W fuzz breaks away from the planar network and grows over the W surface, where the micro-stress in the W surface layer acts as the driving force.
NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
Christoph Metzke, Werner Frammelsberger, Jonas Weber, Fabian Kühnel, K. Zhu, M. Lanza, Günther Benstetter
On the Limits of Scanning Thermal Microscopy of Ultrathin Films
Materials, vol. 13, no. 3
2020
DOI: 10.3390/ma13030518
Abstract anzeigen
Heat transfer processes in micro- and nanoscale devices have become more and more important during the last decades. Scanning thermal microscopy (SThM) is an atomic force microscopy (AFM) based method for analyzing local thermal conductivities of layers with thicknesses in the range of several nm to µm. In this work, we investigate ultrathin films of hexagonal boron nitride (h-BN), copper iodide in zincblende structure (γ-CuI) and some test sample structures fabricated of silicon (Si) and silicon dioxide (SiO2) using SThM. Specifically, we analyze and discuss the influence of the sample topography, the touching angle between probe tip and sample, and the probe tip temperature on the acquired results. In essence, our findings indicate that SThM measurements include artefacts that are not associated with the thermal properties of the film under investigation. We discuss possible ways of influence, as well as the magnitudes involved. Furthermore, we suggest necessary measuring conditions that make qualitative SThM measurements of ultrathin films of h-BN with thicknesses at or below 23 nm possible.
NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
W. Ni, L. Liu, Y. Zhang, C. Niu, H. Fan, G. Song, D. Liu, Günther Benstetter, G. Lei
Effect of intermittent He/D ion irradiations on W nano-fuzz growth over W targets
Vacuum, vol. 173, no. March
2020
DOI: 10.1016/j.vacuum.2019.109146
Abstract anzeigen
The intermittent He/D ion irradiations of polycrystalline W have been performed at the ion energy of 50 eV by changing the time of the single irradiations and the irradiation temperature. All irradiated W specimens have been observed by scanning electron microscopy, and the effect of intermittent He/D ion irradiations on the W fuzz growth has been analyzed. The W fuzz growth over W targets does not show the clear dependence on the intermittent He/D ion irradiations, where the He/D ion fluence of the single irradiations typically varies from 5.0 × 1024 to 2.5 × 1025/m2. However, a slight change in the W surface temperature during the single He ion irradiations significantly affects the W fuzz growth rate. Analysis indicates that W fuzz growth is significantly affected by the total He ion fluence varying from 5.0 × 1024 to 5.0 × 1025/m2 and the irradiation temperature varying from 1100 to 1450 K. This current study will play a crucial role in understanding the W fuzz growth under the periodic He/D ion irradiations of W divertor in fusion reactors, such as ELMs.
NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
Z. Bi, D. Liu, Y. Zhang, L. Liu, Y. Xia, Y. Hong, H. Fan, Günther Benstetter, G. Lei, L. Yan
The evolution of He nanobubbles in tungsten under fusion-relevant He ion irradiation conditions
Nuclear Fusion, vol. 59, no. 8
2019
DOI: 10.1088/1741-4326/ab2472
Abstract anzeigen
He-induced W nanofuzz growth over the W divertor target is one of the main limiting factors affecting the current design and development of fusion reactors. In this paper, based on He reaction rate model in W, we simulate the growth and evolution of He nanobubbles during W nanofuzz formation under fusion-relevant He+ irradiation conditions. Our modeling unveils the existence of He nanobubble-enriched W surface layer (<10 nm), formed due to the He diffusion in W crystal into defect sites. At an elevated temperature, the growth of He bubbles in the W surface layer prevents He atoms diffusing into the deep layer (>10 nm). The formation of W nanofuzz at the surface is attributed to surface bursting of high-density He bubbles with their radius of ~4 nm, and an increase in the surface area of irradiated W. Our findings have been well confirmed by the experimental measurements.
NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
W. Ni, L. Liu, Y. Zhang, H. Fan, G. Song, D. Liu, Günther Benstetter, G. Lei
Mass loss of pure W, W-Re alloys, and oxide dispersed W under ITER-relevant He ion irradiations
Journal of Nuclear Materials, vol. 527
2019
DOI: 10.1016/j.jnucmat.2019.151800
Abstract anzeigen
In this study, polycrystalline W, W-Re alloys, and La2O3 and Y2O3 dispersion-strengthened W have been irradiated by our large-power materials irradiation experimental system (LP-MIES) at the irradiation temperature of 1360–1460 K. Our measurements show that the W nano-fuzz layer which is < 5.2 μm thick has been formed over all the specimens exposed to the low-energy (50 or 100 eV) and high-flux (1.37 × 1022–1.62 × 1022 ions/m2⋅s) He+ irradiations. The mass loss of the fuzz layer almost linearly increases with the He+ fluence, which does not show any dependence on the thickness of fuzz layer varying from 1.1 to 5.2 μm La2O3 and Y2O3 dispersions into W significantly suppress the growth of W fuzz, indicating that He diffusion and the evolution of He nano-bubbles in the near-surface can be significantly influenced due to the dispersion. After He+ (100 eV) irradiation at He+ fluence of 5.83 × 1026/m2, the mass loss of 0.1 vol% - 1.0 vol% La2O3-dispersed W is about 20% lower than the one of the pure W, and the La2O3 dispersed W exhibits the best erosion resistance among various W material grades. Our analysis indicates that both the surface sputtering of W fuzz by energetic ions and surface bursting of He nano-bubbles can be responsible for the mass loss of W under ITER-relevant He+ irradiations.
NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
C. Wen, X. Jing, F. Hitzel, C. Pan, Günther Benstetter, M. Lanza
In Situ Observation of Current Generation in ZnO Nanowire Based Nanogenerators Using a CAFM Integrated into an SEM
ACS Applied Materials & Interfaces, vol. 11, no. 17, pp. 15183-15188
2019
DOI: 10.1021/acsami.9b00447
Abstract anzeigen
In this work, we monitor in situ the movement of ZnO piezoelectric nanowires by using a conductive atomic force microscope integrated into a scanning electron microscope. This setup allows seeing the bending of the nanowires and simultaneously measuring the currents generated. We conclude that the currents generated not only come from piezoelectric effect, but also from contact potential and triboelectric effect. These contributions have been ignored in all previous reports in this field, meaning that the power conversion efficiency of these devices may have been systematically overestimated. Our study helps to clarify the working mechanism of piezoelectric nanogenerators based on ZnO nanowires.
NachhaltigElektrotechnik und MedientechnikIQMAMaschinenbau und MechatronikZeitschriftenartikel
L. Jiang, Jonas Weber, F. Puglisi, P. Pavan, L. Larcher, Werner Frammelsberger, Günther Benstetter, M. Lanza
Understanding Current Instabilities in Conductive Atomic Force Microscopy
Materials, vol. 12, no. 3
2019
DOI: 10.3390/ma12030459
Abstract anzeigen
Conductive atomic force microscopy (CAFM) is one of the most powerful techniques in studying the electrical properties of various materials at the nanoscale. However, understanding current fluctuations within one study (due to degradation of the probe tips) and from one study to another (due to the use of probe tips with different characteristics), are still two major problems that may drive CAFM researchers to extract wrong conclusions. In this manuscript, these two issues are statistically analyzed by collecting experimental CAFM data and processing them using two different computational models. Our study indicates that: (i) before their complete degradation, CAFM tips show a stable state with degraded conductance, which is difficult to detect and it requires CAFM tip conductivity characterization before and after the CAFM experiments; and (ii) CAFM tips with low spring constants may unavoidably lead to the presence of a ~1.2 nm thick water film at the tip/sample junction, even if the maximum contact force allowed by the setup is applied. These two phenomena can easily drive CAFM users to overestimate the properties of the samples under test (e.g., oxide thickness). Our study can help researchers to better understand the current shifts that were observed during their CAFM experiments, as well as which probe tip to use and how it degrades. Ultimately, this work may contribute to enhancing the reliability of CAFM investigations.
NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
L. Liu, S. Li, D. Liu, Günther Benstetter, O. Man, J. Michalicka, Y. Zhang, Y. Hong, H. Fan, W. Ni, Q. Yang, Y. Wu, Z. Bi
The effect of O2 impurity on surface morphology of polycrystalline W during low-energy and high-flux He+ irradiation
Fusion Engineering and Design, vol. 139, pp. 96-103
2019
DOI: 10.1016/j.fusengdes.2019.01.003
Abstract anzeigen
The interaction between the impurities (such as carbon, nitrogen, oxygen) and the plasma-facing materials (PFMs) can profoundly influence the performance and service of the PFMs. In this paper, we investigated the influence of oxygen (O2) impurity in the helium radio frequency (RF) plasma on the surface morphology of polycrystalline tungsten (W) irradiated at the surface temperature of 1450 ± 50 K and the ion energy of 100 eV. The pressure ratio of O2 to He (R) in RF source varied from 4.0 × 10−6 to 9.0 × 10-2. The total irradiation flux and fluence were ˜1.2 × 1022 ions·m-2·s-1 and ˜1.0 × 1026 ions·m-2, respectively. After He+ irradiation, the specimen surface morphology was observed by scanning electron microscopy. It was found that with increasing R from 4.0 × 10−6 to 9.0 × 10-2 the thickness of nano-fuzz layer at the W surface was thinner and thinner, accompanied by the formation of rod-like structures. The erosion yield increased from 5.2 × 10-4 to 2.3 × 10-2 W/ion when R varied from 4.0 × 10-6 to 9.0 × 10-2. The X-ray diffraction analysis shows that tungsten oxides were formed at the near surface of specimens when R exceeded 1.8 × 10-2. The erosion yield measurements revealed that in addition to surface physical sputtering process, the chemical erosion process could occur due to the interaction between oxygen-containing species and W at the surface. The results indicated that the presence of O2 impurity in He plasma can obviously affect the surface microstructure of W. The study suggested that O2 impurity can effectively reduce the growth of nano-fuzz structures.
NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
S. Chen, L. Jiang, M. Buckwell, X. Jing, Y. Ji, E. Grustan-Gutierrez, Günther Benstetter, F. Hui, Y. Shi, M. Rommel, A. Paskaleva, W. Ng, A. Mehonic, A. Kenyon, M. Lanza
On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials
Advanced Functional Materials, vol. 28, no. 52
2018
DOI: 10.1002/adfm.201802266
Abstract anzeigen
Conductive atomic force microscopy (CAFM) has been widely used for electrical characterization of thin dielectrics by applying a gentle contact force that ensures a good electrical contact without inducing additional high‐pressure related phenomena (e.g., flexoelectricity, local heat, scratching). Recently, the CAFM has been used to obtain 3D electrical images of thin dielectrics by etching their surface. However, the effect of the high contact forces/pressures applied during the etching on the electrical properties of the materials has never been considered. By collecting cross‐sectional transmission electron microscopy images at the etched regions, it is shown here that the etching process can modify the morphology of Al2O3 thin films (producing phase change, generation of defects, and metal penetration). It is also observed that this technique severely modifies the electrical properties of pSi and TiO2 wafers during the etching, and several behaviors ignored in previous studies, including i) observation of high currents in the absence of bias, ii) instabilities of etching rate, and iii) degradation of CAFM tips, are reported. Overall, this work should contribute to understand better the limitations of this technique and disseminate it among those applications in which it can be really useful.
NachhaltigElektrotechnik und MedientechnikIQMAZeitschriftenartikel
L. Liu, S. Li, D. Liu, Günther Benstetter, Y. Zhang, Y. Hong, H. Fan, W. Ni, Q. Yang, Y. Wu, Z. Bi
Surface damages of polycrystalline W and La2O3-doped W induced by high-flux He plasma irradiation
Journal of Nuclear Materials, vol. 501, no. April, pp. 275-281
2018
Abstract anzeigen
In this study, polycrystalline tungsten (W) and three oxide dispersed strengthened W with 0.1 vol %, 1.0 vol % and 5.0 vol % lanthanum trioxide (La2O3) were irradiated with low-energy (200 eV) and high-flux (5.8 × 1021 or 1.4 × 1022 ions/m2⋅s) He+ ions at elevated temperature. After He+ irradiation at a fluence of 3.0 × 1025/m2, their surface damages were observed by scanning electron microscopy, energy dispersive spectroscopy, scanning electron microscopy-electron backscatter diffraction, and conductive atomic force microscopy. Micron-sized holes were formed on the surface of W alloys after He+ irradiation at 1100 K. Analysis shows that the La2O3 grains doped in W were sputtered preferentially by the high-flux He+ ions when compared with the W grains. For irradiation at 1550 K, W nano-fuzz was formed at the surfaces of both polycrystalline W and La2O3-doped W. The thickness of the fuzz layers formed at the surface of La2O3-doped W is 40% lower than the one of polycrystalline W. The presence of La2O3 could suppress the diffusion and coalescence of He atoms inside W, which plays an important role in the growth of nanostructures fuzz.
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