Publikationen
Suche nach „[B.] [Wilke]“ hat 3 Publikationen gefunden
Suchergebnis als PDFVortrag
Alexander Hofer, R. Biberger, Günther Benstetter, B. Wilke, H. Göbel
Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films
24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, Frankreich
2013
Zeitschriftenartikel
Alexander Hofer, R. Biberger, Günther Benstetter, B. Wilke, H. Göbel
Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films
Microelectronics Reliability, vol. 53, no. 9-11, pp. 1430-1433
2013
Vortrag
Alexander Hofer, B. Wilke, R. Biberger, Günther Benstetter, H. Göbel
Capacitance and Conductivity Mapping of Organic Films and Devices with Non-Contact SPM Methods
International Workshop on Scanning Probe Microscopy for Energy Applications, Mainz
2011