Publikationen
Suche nach „[Alexander] [Hofer]“ hat 18 Publikationen gefunden
Suchergebnis als PDFBeitrag (Sammelband oder Tagungsband)
Günther Benstetter, Alexander Hofer, D. Liu, Werner Frammelsberger, M. Lanza
Chapter 3: Fundamentals of CAFM Operation Modes
Conductive Atomic Force Microscopy: Applications in Nanomaterials, Weinheim
2017
ISBN: 978-3-527-34091-0
Vortrag
Alexander Hofer, Tobias Berthold, A. Greppmair, M. Brandt, Günther Benstetter
Nanoscale electrical conductivity of laser-sintered Ge nanoparticle layers
The 8th International Conference On Technological Advances Of Thin Films and Surface Coatings (ThinFilms 2016), Singapur, Singapur
2016
Vortrag
Alexander Hofer, Tobias Berthold, A. Greppmair, Günther Benstetter, M. Brandt
Nanoscale characterization of laser-sintered Ge nanoparticle layers
2nd International Conference on Functional Integrated nano Systems (nanoFIS), Graz, Österreich
2016
Zeitschriftenartikel
Y. Ji, H. Fei, Y. Shi, V. Iglesias, D. Lewis, N. Jiebin, S. Long, M. Liu, Alexander Hofer, Werner Frammelsberger, Günther Benstetter, A. Scheuermann, P. McIntyre, M. Lanza
Characterization of the photocurrents generated by the laser of atomic force microscopes
Review of Scientific Instruments, vol. 87, no. 8
2016
Vortrag
K. Schiebl, Alexander Hofer, Günther Benstetter
Atomic Force Microscopy analysis of laser-sintered Germanium nanoparticles for thermoelectric applications
3rd International Congress on Energy Efficiency and Energy Related Materials (ENEFM), Oludeniz, Türkei
2015
Vortrag
Günther Benstetter, Alexander Hofer, A. Greppmair, M. Brandt
A review of physical characterization methods for nanostructured thermoelectric materials
Invited Talk
3rd International Congress on Energy Efficiency and Energy Related Materials (ENEFM), Oludeniz, Türkei
2015
Zeitschriftenartikel
Manuel Bogner, Alexander Hofer, Günther Benstetter, H. Gruber, R.Y.Q. Fu
Differential 3ω method for measuring thermal conductivity of AIN and SI3N4 thin films
Thin Solid Films, vol. 591 Part B, pp. 267-270
2015
DOI: 10.1016/j.tsf.2015.03.031
Zeitschriftenartikel
L. Hamann, Günther Benstetter, Alexander Hofer, M. Mattheis, M. Haas, R. Zapf-Gottwick
Use of Coated-Metal Particles in Rear Busbar Pastes to Reduce Silver Consumption
IEEE Journal of Photovoltaics, vol. 5, no. 2, pp. 534-537
2015
DOI: 10.1109/JPHOTOV.2014.2388080
Vortrag
Manuel Bogner, Günther Benstetter, Alexander Hofer, H. Gruber
The differential 3ω method for measuring the thermal conductivity of AIN and SI3N4 thin films
16th International Conference on Thin Films (ICTF16), Dubrovnik, Kroatien
2014
Vortrag
Günther Benstetter, Alexander Hofer, Tobias Berthold
Selected Atomic Force Microscopy Methods for the Electrical Characterization of Thin Films and Devices
Invited Talk
4th International Advances in Applied Physics and Materials Science Congress & Exhibition (APMAS), Fethiye, Türkei
2014
Vortrag
Alexander Hofer, R. Biberger, Günther Benstetter, B. Wilke, H. Göbel
Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films
24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, Frankreich
2013
Zeitschriftenartikel
Alexander Hofer, R. Biberger, Günther Benstetter, B. Wilke, H. Göbel
Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films
Microelectronics Reliability, vol. 53, no. 9-11, pp. 1430-1433
2013
Zeitschriftenartikel
Alexander Hofer, Günther Benstetter, R. Biberger, C. Leirer, G. Brüderl
Analysis of crystal defects on GaN based semiconductors with advanced scanning probe microscope technique
Thin Solid Films, vol. 544, no. Oktober, pp. 139-143
2013
Vortrag
Alexander Hofer, Günther Benstetter, R. Biberger, C. Leirer, G. Brüderl
Analysis of crystal defects on GaN-based semiconductors with advanced scanning probe microscope techniques
Invited Talk
6th International Conference on Technological Advances of Thin Films & Surface Coatings (THINFILMS2012), Singapur, Singapur
2012
Vortrag
Alexander Hofer, B. Wilke, R. Biberger, Günther Benstetter, H. Göbel
Capacitance and Conductivity Mapping of Organic Films and Devices with Non-Contact SPM Methods
International Workshop on Scanning Probe Microscopy for Energy Applications, Mainz
2011
Vortrag
Günther Benstetter, R. Biberger, Alexander Hofer, H. Göbel
Intermittent-Contact Scanning Capacitance Analysis of Thin Dielectric Films and Semiconductor Devices
Invited Talk
5th International Conference on Technological Advances of Thin Films & Surface Coatings, Harbin, China
2010
Vortrag
Günther Benstetter, Werner Frammelsberger, Edgar Lodermeier, Heiko Ranzinger, D. Liu, Peter Breitschopf, W. Bergbauer, Alexander Hofer
Raster-Sonden-Mikroskopie (SPM) in der Fehler- und Zuverlässigkeitsanalytik
VDE Fehlermechanismen bei kleinen Geometrien, Grainau
2006
Vortrag
Günther Benstetter, Peter Breitschopf, B. Knoll, Edgar Lodermeier, Alexander Hofer, Werner Frammelsberger
Intermittent Contact Scanning Capacitance Microscopy-First Results
Workshop on Scanning Probe Microscopy and Related Techniques, Villach, Österreich
2005