Suche nach „[A.] [Smith]“ hat 4 Publikationen gefunden

NachhaltigF: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenS: TC Teisnach Sensorik

Zeitschriftenartikel

S. Vaziri, A. Smith, M. Östling, G. Lupina, J. Dabrowski, G. Lippert, W. Mehr, F. Driussi, S. Venica, V. Di Leece, A. Gnudi, M. König, Günther Ruhl, M. Belete, M. Lemme

Going ballistic: Graphene hot electron transistors

Solid State Communications, vol. 224, no. December, pp. 64-75

2015

DOI: 10.1016/j.ssc.2015.08.012

F: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenF: Elektrotechnik und MedientechnikF: Maschinenbau und MechatronikI: Hochschulleitung und -einrichtungen

Vortrag

Elmar Pitschke, Markus Schinhärl, Peter Sperber, Rolf Rascher, R. Stamp, L. Smith, M. Smith, A. Hammer

Comparison of a new contact topographical measurement system for spherical and aspherical surfaces with interferometry

Current Developments in Lens Design and Optical Engineering V, Denver, CO, USA

2004

F: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenF: Elektrotechnik und MedientechnikF: Maschinenbau und MechatronikI: Hochschulleitung und -einrichtungen

Zeitschriftenartikel

Elmar Pitschke, Markus Schinhärl, Peter Sperber, Rolf Rascher, R. Stamp, L. Smith, M. Smith, A. Hammer

Comparison of a new contact topographical measurement system for spherical and aspherical surfaces with interferometry

Current Developments in Lens Design and Optical Engineering V, vol. 5523, pp. 225-234

2004

DOI: 10.1117/12.558899

Abstract anzeigen

Since end of 2003 the TII-3D - the new contact topography measuring device for measuring aspherical and spherical surfaces - is available on market. Due to its novel technology, the system is specified to measure a large range with λ/10 accuracy, therefore being a very flexible tool for pre- and post-measurements in high quality zonal polishing processes like MRF. At the University of Applied Sciences Deggendorf a testing series has been carries out to compare the results of the TII-3D with CGH-interferometric measurements on aspherical surfaces. An analysis of the measurement errors is shown and ranking of the different metrology systems for production processes of high quality aspherical lenses is given.

F: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenF: Maschinenbau und Mechatronik

Zeitschriftenartikel

Florian Schneider, Roland Maurer, A. Bickert, R. Stamp, G. Smith, Rolf Rascher

SG-Sensor – an affordable tactile alternative

2002