Suche nach „[A.] [Hammer]“ hat 5 Publikationen gefunden

NachhaltigF: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenS: TC Teisnach Sensorik

Patent

M. Hammer, Günther Ruhl, A. Strasser, M. Melzl, R. Goellner, D. Groteloh

Method of processing a contact pad, method of manufacturing a contact pad, and integrated circuit element

2014

NachhaltigF: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenS: TC Teisnach Sensorik

Patent

M. Hammer, Günther Ruhl, A. Strasser, M. Melzl, R. Goellner, D. Groteloh

Method of processing a contact pad, method of manufacturing a contact pad, and integrated circuit element

2010

DigitalF: Maschinenbau und MechatronikI: Institut für Existenzgründung

Buch (Monographie)

Thomas Bartscher, A. Hammer, J. Stöckl

Personalentwicklung

Lehrbriefreihe AKAD GmbH

2009

F: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenF: Elektrotechnik und MedientechnikF: Maschinenbau und MechatronikI: Hochschulleitung und -einrichtungen

Vortrag

Elmar Pitschke, Markus Schinhärl, Peter Sperber, Rolf Rascher, R. Stamp, L. Smith, M. Smith, A. Hammer

Comparison of a new contact topographical measurement system for spherical and aspherical surfaces with interferometry

Current Developments in Lens Design and Optical Engineering V, Denver, CO, USA

2004

F: Angewandte Naturwissenschaften und WirtschaftsingenieurwesenF: Elektrotechnik und MedientechnikF: Maschinenbau und MechatronikI: Hochschulleitung und -einrichtungen

Zeitschriftenartikel

Elmar Pitschke, Markus Schinhärl, Peter Sperber, Rolf Rascher, R. Stamp, L. Smith, M. Smith, A. Hammer

Comparison of a new contact topographical measurement system for spherical and aspherical surfaces with interferometry

Current Developments in Lens Design and Optical Engineering V, vol. 5523, pp. 225-234

2004

DOI: 10.1117/12.558899

Abstract anzeigen

Since end of 2003 the TII-3D - the new contact topography measuring device for measuring aspherical and spherical surfaces - is available on market. Due to its novel technology, the system is specified to measure a large range with λ/10 accuracy, therefore being a very flexible tool for pre- and post-measurements in high quality zonal polishing processes like MRF. At the University of Applied Sciences Deggendorf a testing series has been carries out to compare the results of the TII-3D with CGH-interferometric measurements on aspherical surfaces. An analysis of the measurement errors is shown and ranking of the different metrology systems for production processes of high quality aspherical lenses is given.