Suche nach „[A.] [Hammer]“ hat 5 Publikationen gefunden

NachhaltigAngewandte Naturwissenschaften und WirtschaftsingenieurwesenTC Teisnach Sensorik

Patent

M. Hammer, Günther Ruhl, A. Strasser, M. Melzl, R. Goellner, D. Groteloh

Method of processing a contact pad, method of manufacturing a contact pad, and integrated circuit element

2014

NachhaltigAngewandte Naturwissenschaften und WirtschaftsingenieurwesenTC Teisnach Sensorik

Patent

M. Hammer, Günther Ruhl, A. Strasser, M. Melzl, R. Goellner, D. Groteloh

Method of processing a contact pad, method of manufacturing a contact pad, and integrated circuit element

2010

DigitalInstitut für ExistenzgründungMaschinenbau und Mechatronik

Buch (Monographie)

Thomas Bartscher, A. Hammer, J. Stöckl

Personalentwicklung

Lehrbriefreihe AKAD GmbH

2009

Angewandte Naturwissenschaften und WirtschaftsingenieurwesenElektrotechnik und MedientechnikHochschulleitung und -einrichtungenMaschinenbau und Mechatronik

Vortrag

Elmar Pitschke, Markus Schinhärl, Peter Sperber, Rolf Rascher, R. Stamp, L. Smith, M. Smith, A. Hammer

Comparison of a new contact topographical measurement system for spherical and aspherical surfaces with interferometry

Current Developments in Lens Design and Optical Engineering V, Denver, CO, USA

2004

Angewandte Naturwissenschaften und WirtschaftsingenieurwesenElektrotechnik und MedientechnikHochschulleitung und -einrichtungenMaschinenbau und Mechatronik

Zeitschriftenartikel

Elmar Pitschke, Markus Schinhärl, Peter Sperber, Rolf Rascher, R. Stamp, L. Smith, M. Smith, A. Hammer

Comparison of a new contact topographical measurement system for spherical and aspherical surfaces with interferometry

Current Developments in Lens Design and Optical Engineering V, vol. 5523, pp. 225-234

2004

DOI: 10.1117/12.558899

Abstract anzeigen

Since end of 2003 the TII-3D - the new contact topography measuring device for measuring aspherical and spherical surfaces - is available on market. Due to its novel technology, the system is specified to measure a large range with λ/10 accuracy, therefore being a very flexible tool for pre- and post-measurements in high quality zonal polishing processes like MRF. At the University of Applied Sciences Deggendorf a testing series has been carries out to compare the results of the TII-3D with CGH-interferometric measurements on aspherical surfaces. An analysis of the measurement errors is shown and ranking of the different metrology systems for production processes of high quality aspherical lenses is given.