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Suche nach „[A.] [Benemann]“ hat 3 Publikationen gefunden
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    Elektrotechnik und Medientechnik

    Zeitschriftenartikel

    A. Benemann, C.-C. Seifert, H.-G. Spillekothen, A. Boden, D. Braeunig, F. Wulf, Detlef Brumbi, J. Klein, J. Schott

    Irradiation qualification tests on electronic devices and circuits

    Kerntechnik, vol. 56, no. 3, pp. 157-160

    1991

    Abstract anzeigen

    Reliable prediction of the irradiation behavior of electronic devices and circuits cannot be made without qualified irradiation tests. A variety of irradiation facilities for various types of radiation provide for standardized testing. Very accurate dosimetry and comprehensive documentation of the results are mandatory in these tests. A PC-oriented database for storing and retrieving test results is being developed. (orig.)

    Elektrotechnik und Medientechnik

    Zeitschriftenartikel

    A. Benemann, C.-C. Seifert, H.-G. Spillekothen, A. Boden, D. Braeunig, F. Wulf, Detlef Brumbi, J. Klein, J. Schott

    The hardening techniques for electronic devices and circuits

    Kerntechnik, vol. 56, no. 1, pp. 29-32

    1991

    Abstract anzeigen

    The deleterious effects of radiation on electronic devices and circuits make the hardening against degradation, failure and upset indispensable. Hardening may be accomplished by one or more of several different means, including technological processes, appropriate design of devices and circuits, as well as careful piecepart screening procedures. The various possibilities are outlined and discussed. Special emphasis is put on the authors' investigations on qualified components and circuit designs. A selection of proper physical properties and bias conditions of single components as well as an optimization of circuit layouts can help to minimize radiation damage and thus make electronic devices and circuits more radiation tolerant. (orig.)

    Elektrotechnik und Medientechnik

    Zeitschriftenartikel

    A. Benemann, A. Boden, D. Bräunig, Detlef Brumbi, J. Klein, J-U. Schott, C.-C. Seifert, H.-G. Spillekothen, F. Wulf

    The effects of radiation on electronic devices and circuits

    Kerntechnik, vol. 55, no. 5, pp. 261-267

    1990

    Abstract anzeigen

    Radiation damage of semiconductor components constitutes a safety risk for the functioning of circuits when operated in a radiation-exposed environment. Despite the manifold dependences of the radiation damage, fundamental characteristic features are given so that sensitivity graduations of the active component spectrum can be established. A general description of the sensitivity and the most important parameter changes of devices is given by introducing the main damage mechanisms, as displacements of lattice atoms and ionization effects. Recently obtained results from experiments on the radiation susceptibility of charge coupled devices as well as on the influences of single component degradations on circuit behavior are presented.